Further reading


 * Bennett, Herbert S. (January–February 2007). "Will Future Measurement Needs of the Semiconductor Industry be Met?" (PDF). Journal of Research of the National Institutes of Standards and Technology 112 (1): 25–38.
 * Esmaeilzadeh, Hadi, Emily R. Blem, Renée St. Amant, Karthikeyan Sankaralingam, Doug Burger (2011). "Dark silicon and the end of multicore scaling." (PDF). Proceedings of ISCA'2011: 365–376.